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Spatial Point Patterns Methodology and Applications with R by Adrian Baddeley ISBN: 978-1482210200

Spatial Point Patterns Methodology and Applications with R by Adrian Baddeley ISBN: 978-1482210200

$19.99 USD
$19.99 USD
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About this Hardcover

ISBN-13
9781482210200
Author
Adrian Baddeley,Ege Rubak,Rolf Turner
Publisher
Taylor & Francis
Edition
1
Published
2015-11-25
Pages
824
Binding
Hardcover

Verified US edition — ISBN 9781482210200

ISBN 9781482210200 identifies the 1 of Spatial Point Patterns Methodology and Applications with R by Adrian Baddeley by Adrian Baddeley,Ege Rubak,Rolf Turner, published by Taylor & Francis (2015-11-25). Every copy autoxdx ships against this ISBN is the genuine US-edition print run from the original publisher's authorized US distribution — no overseas reprints, no scanned facsimiles, no "international edition" rebranding. Verify this ISBN against your professor's syllabus before checkout.

About Taylor & Francis

Routledge and its sister imprints CRC Press, Focal Press, and Taylor & Francis are part of Informa plc — together producing reference works across counseling, social sciences, language studies, engineering, and academic specialties. CRC Press's medical and clinical references (50 Landmark Papers series, surgical atlases) are board-prep staples. Routledge social-sciences titles dominate graduate-level reading lists. We source Routledge family titles directly from authorized US distribution.

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